Ellipsometric study of active layers in ternary organic solar cells

Abstract

In this paper, the surface analysis of three-component thin films for use as the active layer of ternary photovoltaic cells is carried out. Spectroscopic ellipsometry was chosen as the test method. Surface mapping was performed for thin films with selected dopants. The Cody-Lorentz model was fitted to the experimental data, and thicknesses and roughnes’s of the layers were determined. The surface distribution of the refractive index and extinction coefficient was also demonstrated.